Goldstein, Joseph / Newbury, Dale E. et al. Scanning Electron Microscopy and X-Ray Microanalysis - Third Edition. Springer, 2013.

eng

Joseph Goldstein / Dale E. Newbury / David C. Joy / Charles E. Lyman / Patrick Echlin / Eric Lifshin / Linda Sawyer / J. R. Michael

Scanning Electron Microscopy and X-Ray Microanalysis

Third Edition

Springer
2013

Taschenbuch
720 Seiten
ISBN 9781461349693

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.