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Cookie akzeptierenJoseph Goldstein / Dale E. Newbury / Patrick Echlin / Eric Lifshin / Alton D. Romig Jr. / Charles E. Lyman / Charles Fiori / David C. Joy
Scanning Electron Microscopy and X-Ray Microanalysis
- Springer US
- 2011
- Taschenbuch
- 844 Seiten
- ISBN 9781461276531
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B,
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