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Cookie akzeptieren![Goldstein, Joseph / Newbury, Dale E. et al. Scanning Electron Microscopy and X-Ray Microanalysis - A Text for Biologists, Materials Scientists, and Geologists. Springer US, 2013.](https://eichendorff21.de/cdata/IjhX-yp13PdSWfdaXy_MeVoa3dg=/300x0/9781461332756.png)
Joseph Goldstein / Dale E. Newbury / Eric Lifshin / David C. Joy / Charles Fiori / Patrick Echlin
Scanning Electron Microscopy and X-Ray Microanalysis
- Springer US
- 2013
- Taschenbuch
- 692 Seiten
- ISBN 9781461332756
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of
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