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Cookie akzeptierenM. Ray Mercer / Kenneth M. Butler
Assessing Fault Model and Test Quality
- Springer US
- 1991
- Gebunden
- 156 Seiten
- ISBN 9780792392224
For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is
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