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Cookie akzeptierenLocal Pattern Detection
- Springer Berlin Heidelberg
- 2005
- Taschenbuch
- 248 Seiten
- ISBN 9783540265436
Introduction The dramatic increase in available computer storage capacity over the last 10 years has led to the creation of very large databases of scienti?c and commercial information. The need to analyze these masses of data has led to the evolution of the new ?eld knowledge discovery in databases (KDD) at the intersection of machine learning, statistics and database technology. Being interdisciplinary by nature, the ?eld o?ers the opportunity to combine the expertise of di?erent ?elds intoacommonobjective. Moreover,withineach?elddiversemethodshave been developed and justi?ed with respect to di?erent quality criteria. We have toinvestigatehowthesemethods cancontributeto solvingthe problemofKDD. Traditionally, KDD was seeking to ?nd global models for the data that
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