Felix Hoffmann
Reliability and Reliability Testing of Silicon Carbide Power Devices Under Electro-Chemical and Thermo-Mechanical Stress
- Shaker Verlag
- 2026
- Taschenbuch
- 279 Seiten
- ISBN 9783819109379
59,80
€
inkl. MwSt.zzgl. Versand
Am 13.12.2026