Hoffmann, Felix. Reliability and Reliability Testing of Silicon Carbide Power Devices Under Electro-Chemical and Thermo-Mechanical Stress. Shaker Verlag, 2026.
eng

Felix Hoffmann

Reliability and Reliability Testing of Silicon Carbide Power Devices Under Electro-Chemical and Thermo-Mechanical Stress

  • Shaker Verlag
  • 2026
  • Taschenbuch
  • 279 Seiten
  • ISBN 9783819109379

Am 13.12.2026