Peter Pichler
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon
- Springer Vienna
- 2012
- Taschenbuch
- 588 Seiten
- ISBN 9783709172049
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
320,99
€
inkl. MwSt.zzgl. Versand
in Kürze