Britain 55, USA 20. Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine. Poland, South Africa. As at the latest congress in Paris the following central topics were treated: Gent>ral problems of X-ray optics, physical bases of electron beam microanalysis. quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal­ lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for tht> car·eful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation.