Otwin Breitenstein / Martin C. Schubert / Wilhelm Warta
Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials
- Springer International Publishing
- 2019
- Gebunden
- 344 Seiten
- ISBN 9783319998244
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
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