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Cookie akzeptieren![Hirler, Alexander. New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses. Cuvillier, 2021.](https://eichendorff21.de/cdata/X3saXjRnO78GXLSkW2YVskJqC_4=/300x0/9783736975200.png)
Alexander Hirler
New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses
- Cuvillier
- 2021
- Taschenbuch
- 166 Seiten
- ISBN 9783736975200
In the present work, urgent issues in the reliability qualification of semiconductor devices are addressed, which particularly affect value chains such as those in the automotive industry. These have particularly high requirements for long lifetime and low failure rates of their products, which are additionally exposed to more extreme operating and environmental conditions than in most other areas of application. In particular, the question arises on how to assess a product or semiconductor technology against the requirement of an application-specific mission profile with multiple non- constant stressors. For this purpose, the behavior of failure distributions under varying and progressive stress loads is investigated and described using
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