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Kaushik, Brajesh Kumar / Virendra Singh et al (Hrsg.). VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ¿ July 2, 2017, Revised Selected Papers. Springer Nature Singapore, 2017.
eng

VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 ¿ July 2, 2017, Revised Selected Papers
  • Springer Nature Singapore
  • 2017
  • Taschenbuch
  • 840 Seiten
  • ISBN 9789811074691
Herausgeber: Brajesh Kumar Kaushik / Virendra Singh / Sudeb Dasgupta

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

in Kürze