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Cookie akzeptieren![Kaushik, Brajesh Kumar / Virendra Singh et al (Hrsg.). VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ¿ July 2, 2017, Revised Selected Papers. Springer Nature Singapore, 2017.](https://eichendorff21.de/cdata/81LaSMw2M1IYnII2q2XtT-qP1wI=/300x0/9789811074691.png)
VLSI Design and Test
- Springer Nature Singapore
- 2017
- Taschenbuch
- 840 Seiten
- ISBN 9789811074691
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
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in Kürze