Bai, Xiao / Edwin R. Hancock et al (Hrsg.). Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17¿19, 2018, Proceedings. Springer International Publishing, 2018.
eng

Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17¿19, 2018, Proceedings
  • Springer International Publishing
  • 2018
  • Taschenbuch
  • 540 Seiten
  • ISBN 9783319977843
Herausgeber: Xiao Bai / Edwin R. Hancock / Antonio Robles-Kelly / Richard C. Wilson / Battista Biggio / Tin Kam Ho

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.

in Kürze