- John Wiley & Sons
- 1995
- Gebunden
- 480 Seiten
- ISBN 9780471589440
Long proven as an analytical tool of uncommon accuracy and utility, particle- induced X-ray emission has enjoyed a solid, if narrow, reputation in the area of chemical analysis. Capable of detecting elemental concentrations down to parts per million, PIXE is now a standard component of the analytical arsenal of the nuclear physics laboratory. Yet in wider avenues of chemical research, PIXE technology is still relatively new and untested. An inside look at the nuts and bolts of PIXE from specialists who've refined the technique in biomedicine, atmospheric science, geology, and art and archaeology, this comprehensive introduction to PIXE reveals its conceptual foundation and unique methodology as
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