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Cookie akzeptieren![Lyman, Charles E. / Lifshin, Eric et al. Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy - A Laboratory Workbook. Springer US, 1990.](https://eichendorff21.de/cdata/k4iN0AyCLn1fccr_ePsj30euDP4=/300x0/9780306435911.png)
Charles E. Lyman / Eric Lifshin / John Armstrong / Dale E. Newbury / Joseph Goldstein / David B. Williams / Alton D. Romig Jr. / Klaus-Rüdiger Peters / Patrick Echlin / Charles Fiori / David C. Joy
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
- Springer US
- 1990
- Taschenbuch
- 424 Seiten
- ISBN 9780306435911
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and
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